The Detection of DNA using a Silicon Nanopore

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 2003, Pages 767-770

  Heng, J B ^a   Dimitrov, V ^a   Grinkova, Y V ^a   Ho, C ^a   Kim, T ^a   Muller, D ^b   Sugar, S ^a   Sorsch, T ^a   Twesten, R ^a   Timp, R ^a   Timp, G ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^b Cornell ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BASE PAIR RESOLUTION; MOLECULAR COULTER COUNTER; MOLECULAR DETECTION; SILICON NANOPORES;

ATOMIC FORCE MICROSCOPY; CMOS INTEGRATED CIRCUITS; DNA; ELECTRON BEAMS; IONIC CONDUCTION; NANOSTRUCTURED MATERIALS; PROTEINS; TRANSMISSION ELECTRON MICROSCOPY;

SILICON;

EID: 17644438133     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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