Active polarimetric assessment of surface weathering

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5575, Issue , 2004, Pages 38-43

  Hoover, Brian G ^a   Peredo, R Anthony ^b   DeSandre, Lewis F ^c   Ulibarri, Laura J ^c  

^a Advanced Optical Technologies   (United States)

^b Textron Systems Division   (United States)

^c AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE ATTENUATION; LASER APPLICATIONS; LIGHT POLARIZATION; MATRIX ALGEBRA; POLARIMETERS; REMOTE SENSING; SOLAR RADIATION;

ACTIVE POLARIMETRY; MUELLER MATRICES; OPTICAL REMOTE SENSING; SURFACE WEATHERING;

WEATHERING;

EID: 17644410418     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.565708     Document Type: Conference Paper

References (5)

1. S. Breugnot and P. Clemenceau, "Modeling and performances of a polarization active imager at λ = 806nm," Opt. Eng. 39(10), 2681-2688 (2000).
2. B. G. Hoover, D. C. Dayton, J. E. Havey, J. D. Gonglewski, V. L. Gamiz, and L. J. Ulibarri, "Active detection of off-diagonal Mueller elements of rough targets," in Polarization Science and Remote Sensing, J. A. Shaw and J. S. Tyo, eds., Proc. SPIE 5851, 226-238 (2003).
3. J. W. Goodman, Statistical Optics (Wiley, New York, 1985), Chap. 3.
4. F. Perrin, "Polarization of light scattered by isotropic opalescent media," J. Chem. Phys. 10, 415-427 (1942).
5. R. A. Chipman, "Polarimetry," in Handbook of Optics, (McGraw-Hill, New York, 1994), Chap. 22.