Phase stability tuning in the Nbx Zr1-xN thin-film system for large stacking fault density and enhanced mechanical strength

Applied Physics Letters

Volumn 86, Issue 13, 2005, Pages 1-3

  Joelsson, T ^a   Hultman, L ^a   Hugosson, H W ^b   Molina Aldareguia, J M ^c  

^a LINKÖPING UNIVERSITY   (Sweden)

^b UPPSALA UNIVERSITY   (Sweden)

^c CEIT   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATIONS (CRYSTALS); NITRIDES; NUCLEATION; PROBABILITY DENSITY FUNCTION; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

DEFECT DENSITY; NITRIDE COATINGS; PHASE STABILITY; TRANSITION METAL NITRIDES (TMN);

THIN FILMS;

EID: 17644402784     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1884743     Document Type: Article

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