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Volumn 5612, Issue , 2004, Pages 72-77

Uncooled IRFPA with high-performance and low-thermal time constant

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; BOLOMETERS; CAMERAS; CMOS INTEGRATED CIRCUITS; ELECTROOPTICAL EFFECTS; INFRARED IMAGING; PHOTOLITHOGRAPHY; SENSITIVITY ANALYSIS;

EID: 17644391366     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.578227     Document Type: Conference Paper
Times cited : (11)

References (2)
  • 1
    • 1342332630 scopus 로고    scopus 로고
    • Low cost amorphous silicon based 160 × 120 uncooled microbolometer 2D array for high volume applications
    • Infrared Technology and Applications XXIX, edited by Bjorn F. Andresen, Gabor F. Fulop, (SPIE Bellingham, WA)
    • J.L. Tissot, A. Astier, J.P. Chatard, S. Tinnes, C.Trouilleau, J.J. Yon "Low cost amorphous silicon based 160 × 120 uncooled microbolometer 2D array for high volume applications", in Proceeding of SPIE Vol. 5074, Infrared Technology and Applications XXIX, edited by Bjorn F. Andresen, Gabor F. Fulop, (SPIE Bellingham, WA, 2003), p 511-517
    • (2003) Proceeding of SPIE , vol.5074 , pp. 511-517
    • Tissot, J.L.1    Astier, A.2    Chatard, J.P.3    Tinnes, S.4    Trouilleau, C.5    Yon, J.J.6
  • 2
    • 0032664791 scopus 로고    scopus 로고
    • Amorphous silicon based uncooled microbolometer IRFPA
    • "Infrared Technology and Application XXV", (SPIE Bellingham, WA)
    • C. Vedel, J.L. Martin, J.L. Ouvrier-Buffet, J.L. Tissot, M. Vilain, J.J. Yon, "Amorphous silicon based uncooled microbolometer IRFPA", in Proceeding of SPIE Vol. 3698, "Infrared Technology and Application XXV", (SPIE Bellingham, WA, 1999).
    • (1999) Proceeding of SPIE , vol.3698
    • Vedel, C.1    Martin, J.L.2    Ouvrier-Buffet, J.L.3    Tissot, J.L.4    Vilain, M.5    Yon, J.J.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.