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Volumn 89, Issue 2, 2005, Pages 139-194
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Atomic data and spectral line intensities for Ar XII
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Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER CONCENTRATION;
ELECTRON DENSITY MEASUREMENT;
POPULATION STATISTICS;
SPECTROSCOPY;
ATOMIC DATA;
COLLISION STRENGTH;
DATA LINE;
DISTORTED WAVES;
ELECTRON-IMPACT;
EXCITATION RATE;
IMPACT COLLISION;
RATE COEFFICIENTS;
SPECTRAL LINE INTENSITIES;
WAVE APPROACH;
ELECTRON TEMPERATURE;
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EID: 17544364265
PISSN: 0092640X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.adt.2005.02.001 Document Type: Article |
Times cited : (10)
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References (29)
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