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Volumn 41, Issue 4, 2004, Pages 190-198
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In-Situ Lift-Out of TEM - Samples by Micro Manipulation in a Scanning Electron Microscope;In-situ lift-out von TEM - Proben durch Mikromanipulation in einem Rasterelektronenmikroskop
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRON BEAM DEPOSITION;
MICRO MANIPULATORS;
VACUUM CHAMBERS;
CONTACT POINTS;
ELECTRON BEAM-INDUCED DEPOSITION;
HIGH-PRECISION;
LIFT OUTS;
MICRO MANIPULATION;
TEM GRIDS;
DEPOSITION;
SCANNING ELECTRON MICROSCOPY;
TRANSMISSION ELECTRON MICROSCOPY;
VACUUM APPLICATIONS;
ELECTRONS;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
MICROMANIPULATORS;
NEEDLES;
ELECTRON BEAMS;
SCANNING ELECTRON MICROSCOPY;
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EID: 2142639442
PISSN: 0032678X
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
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Times cited : (6)
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References (7)
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