Single-shot readout with the radio-frequency single-electron transistor in the presence of charge noise

Applied Physics Letters

Volumn 86, Issue 14, 2005, Pages 1-3

  Buehler, T M ^a   Reilly, D J ^a   Starrett, R P ^a   Greentree, Andrew D ^a   Hamilton, A R ^a   Dzurak, A S ^a   Clark, R G ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COMPUTERS; ELECTRON TRAPS; GATES (TRANSISTOR); NATURAL FREQUENCIES; NETWORKS (CIRCUITS); RADIO TELEGRAPH; SOLID STATE DEVICES; SPURIOUS SIGNAL NOISE;

CHARGE NOISE; RADIO-FREQUENCY; SINGLE ELECTRON TRANSISTORS (SET); SINGLE-SHOT READOUT;

TRANSISTORS;

EID: 17444424926     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1897423     Document Type: Article

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