Microstructural studies on a high quality YBa2Cu3O7-δ/YSZ/Si multilayer prepared by pulsed-laser deposition

Superconductor Science and Technology

Volumn 13, Issue 4, 2000, Pages 362-367

  Wang, S J ^a   Xu, S Y ^a   You, L P ^a   Lim, S L ^a   Ong, C K ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; DEPOSITION; HIGH TEMPERATURE SUPERCONDUCTORS; INTERFACES (MATERIALS); OXIDE SUPERCONDUCTORS; PULSED LASER APPLICATIONS; SILICON WAFERS; SURFACE ROUGHNESS; THIN FILMS; YTTRIUM BARIUM COPPER OXIDES; ZIRCONIA;

ROOT MEAN SQUARE ROUGHNESS;

SUPERCONDUCTING FILMS;

EID: 0033879455     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/13/4/305     Document Type: Article

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