Direct resistance comparisons from the QHR to 100 MΩ using a cryogenic current comparator

IEEE Transactions on Instrumentation and Measurement

Volumn 54, Issue 2, 2005, Pages 525-528

  Elmquist, Randolph E ^a   Hourdakis, Emmanouel ^a   Jarrett, Dean G ^a   Zimmerman, Neil M ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Johnson noise; Quantum Hall effect; Resistance standards; Single electron tunneling

Indexed keywords

BRIDGE CIRCUITS; COMPARATOR CIRCUITS; ELECTRIC CURRENT MEASUREMENT; ELECTRIC WINDINGS; ELECTRON TUNNELING; HALL EFFECT; RESISTORS; SPURIOUS SIGNAL NOISE; THIN FILMS;

CRYOGENIC CURRENT COMPARATOR; JOHNSON NOISE; QUANTUM HALL EFFECT; RESISTANCE STANDARDS; SINGLE ELECTRON TUNNELING;

ELECTRIC RESISTANCE MEASUREMENT;

EID: 17444394788     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2004.843330     Document Type: Article

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