Manipulating single electrons with a seven-junction pump

IEEE Transactions on Instrumentation and Measurement

Volumn 54, Issue 2, 2005, Pages 670-672

  Hof, Christian ^a   Jeanneret, Blaise ^a   Eichenberger, Ali ^a   Overney, Frédéric ^a   Keller, Mark W ^b   Dalberth, M J ^b  

^a Swiss Federal Statistical Office   (Switzerland)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Accuracy; Coulomb blockade; Electrical metrology; Electron pump; Electron transistor; Single electron devices

Indexed keywords

CAPACITORS; COULOMB BLOCKADE; CURRENT VOLTAGE CHARACTERISTICS; ELECTROMETERS; ELECTRON DEVICES; ELECTRON TUNNELING; SCHEMATIC DIAGRAMS; TRANSISTORS;

CAPACITANCE STANDARD; ELECTRON PUMP; ELECTRON TRANSISTOR; SINGLE ELECTRON DEVICES;

CAPACITANCE MEASUREMENT;

EID: 17444387922     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2004.843066     Document Type: Article

References (8)

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