Influence of temperature on the dielectric and ferroelectric properties of bismuth titanate thin films obtained by the polymeric precursor method

Materials Chemistry and Physics

Volumn 92, Issue 2-3, 2005, Pages 373-378

  Simoes A Z ^a   Ramirez, M A ^a   Riccardi, C S ^a   Ries, A ^a   Longo, E ^b   Varela, J A ^a  

^a SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

^b FEDERAL UNIVERSITY OF SÃO CARLOS   (Brazil)

Author keywords

Bismuth titanate; Dielectric properties; Ferroelectric properties; Thin film

Indexed keywords

ATOMIC FORCE MICROSCOPY; CAPACITANCE; CRYSTALLIZATION; FATIGUE TESTING; FERROELECTRICITY; HEAT TREATMENT; PERMITTIVITY; REMANENCE; SCANNING ELECTRON MICROSCOPY; THERMAL EFFECTS;

BISMUTH TITANATE; DOMAIN SWITCHING; FERROELECTRIC PROPERTIES; REMANENT POLARIZATION;

THIN FILMS;

EID: 17444384923     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2005.01.043     Document Type: Article

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