메뉴 건너뛰기




Volumn 666, Issue , 2001, Pages

Ion-beam assisted deposition of MgO with in situ RHEED monitoring to control Bi-axial texture

Author keywords

[No Author keywords available]

Indexed keywords

FILM GROWTH; ION BEAM ASSISTED DEPOSITION; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SUBSTRATES; TEXTURES; X RAY DIFFRACTION ANALYSIS;

EID: 17344387976     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-666-f10.6     Document Type: Conference Paper
Times cited : (6)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.