Ultra-thin bi-axially textured IBAD MgO template layers resolved by grazing incidence X-ray diffraction

Physica C: Superconductivity and its Applications

Volumn 355, Issue 3-4, 2001, Pages 293-298

  Groves, James R ^a   Yashar, Philip C ^a   Arendt, Paul N ^a   DePaula, Raymond F ^a   Peterson, Eric J ^a   Fitzsimmons, Michael R ^b  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

Bi axial texture; High energy electron diffraction; Ion beam assisted deposition; Ion bombardment; Magnesium oxide; X ray diffraction

Indexed keywords

DIFFRACTOMETERS; EPITAXIAL GROWTH; FILM GROWTH; ION BEAM ASSISTED DEPOSITION; ION BOMBARDMENT; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; TEXTURES; ULTRATHIN FILMS; X RAY DIFFRACTION ANALYSIS;

GRAZING INCIDENCE DIFFRACTOMETRY (GID); HOMOEPITAXY;

MAGNESIA;

EID: 0035876012     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(01)00082-X     Document Type: Article

References (11)