Analysis of minority carrier diffusion in the presence of a dislocation array: Effective diffusion length, luminescence efficiency and dark current

Solid State Phenomena

Volumn 63-64, Issue , 1998, Pages 45-52

  Donolato, C ^a  

^a CNR   (Italy)

Author keywords

Collection Probability; Diffusion length; Dislocations; Luminescence Efficiency; Minority Carrier Recombination

Indexed keywords

CHARGE CARRIERS; DIFFUSION IN SOLIDS; DISLOCATIONS (CRYSTALS); ELECTRIC CURRENTS; FUNCTIONS; LUMINESCENCE; PROBABILITY; SEMICONDUCTOR DIODES; SEMICONDUCTOR JUNCTIONS; THIN FILM DEVICES;

CARRIER DIFFUSION; DARK CURRENTS; DIFFUSION LENGTH;

SEMICONDUCTOR MATERIALS;

EID: 17344365786     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/ssp.63-64.45     Document Type: Article

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