Dielectric function of Si nanocrystals embedded in SiO2

Thin Solid Films

Volumn 455-456, Issue , 2004, Pages 335-338

  Gallas, B ^a   Kao, Chih Cheng ^a   Defranoux, C ^b   Fisson, S ^a   Vuye, G ^a   Rivory, J ^a  

^a SORBONNE UNIVERSITÉ   (France)

^b SOPRA   (France)

Author keywords

Dielectric function; Ellipsometry; Quantum confinement; Thin films

Indexed keywords

ANNEALING; DIELECTRIC PROPERTIES; ELLIPSOMETRY; NANOSTRUCTURED MATERIALS; PHOTOLUMINESCENCE; QUANTUM THEORY; THIN FILMS;

CRITICAL POINTS; DIELECTRIC FUNCTIONS; NANOCRYSTALS; QUANTUM CONFINEMENT;

SILICA;

EID: 17144457789     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.11.198     Document Type: Conference Paper

References (14)

1. Delerue C., Allan G., Lannoo M. J. Lumin. 80:1999;65.
2. Theiß W. Surf. Sci. Rep. 29:1997;91.
3. Fried M., Wormeester H., Zoethout E., Lohner T., Polgár O., Bársony I. Thin Solid Films. 313-314:1998;549.
4. Rossow U., Frotscher U., Pietryga C., Aspnes D.E., Richter W. Appl. Surf. Sci. 104-105:1996;552.
5. Charvet S., Madelon R., Gourbilleau F., Rizk R. J. Appl. Phys. 85:1999;4032.
6. Amans D., Collard S., Gagnaire A., Joseph J., Ledoux G., Huisken F. J. Appl. Phys. 93:2003;4173.
7. Weissker H.-Ch., Furthmüller J., Bechstedt F. Phys. Rev. B. 65:2002;155 327-155 328.
8. Wang L.-W., Zunger A. Phys. Rev. Lett. 73:1994;1039.
9. Delerue C., Allan G., Lannoo M. Phys. Rev. B. 48:1993;11 024.
10. Jellison G.E., Modine F.A. J. Appl. Phys. 53:1982;3745.
11. Adachi S. Phys. Rev. B. 38:1988;12966.
12. C.-C. Kao, C. Barthou, B. Gallas, S. Fisson, G. Vuye, J. Rivory, E-MRS spring meeting, 10-13 June 2003, Strasbourg, France.
13. Kahler U., Hofmeister H. Opt. Mat. 17:2001;83.
14. Koshida N., Koyama H., Suda Y., Yamamoto Y., Araki M., Saito T., Sato K., Sata N., Shin S. Appl. Phys. Lett. 63:1993;2774.