|
Volumn 473-474, Issue , 2005, Pages 279-286
|
Development and evaluation of a microscopic method for determination of adhesion strength
|
Author keywords
Adhesion; AFM; Interfacial energy; Nanostructured surface
|
Indexed keywords
ATOMIC FORCE MICROSCOPY;
INTERFACIAL ENERGY;
MORPHOLOGY;
NANOSTRUCTURED MATERIALS;
SURFACE PHENOMENA;
TRIBOLOGY;
ADHESION STRENGTH;
AFM;
CHEMICAL INHOMOGENEITIES;
NANOSTRUCTURED SURFACES;
ADHESION;
|
EID: 17044431540
PISSN: 02555476
EISSN: 16629752
Source Type: Book Series
DOI: 10.4028/0-87849-957-1.279 Document Type: Conference Paper |
Times cited : (3)
|
References (12)
|