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Volumn 473-474, Issue , 2005, Pages 279-286

Development and evaluation of a microscopic method for determination of adhesion strength

Author keywords

Adhesion; AFM; Interfacial energy; Nanostructured surface

Indexed keywords

ATOMIC FORCE MICROSCOPY; INTERFACIAL ENERGY; MORPHOLOGY; NANOSTRUCTURED MATERIALS; SURFACE PHENOMENA; TRIBOLOGY;

EID: 17044431540     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-957-1.279     Document Type: Conference Paper
Times cited : (3)

References (12)
  • 11
    • 17044367696 scopus 로고    scopus 로고
    • Gy. Tolnai, P. Nagy, B. Bancsi, T. Seszták, E. Kálmán; in prep.
    • Gy. Tolnai, P. Nagy, B. Bancsi, T. Seszták, E. Kálmán; in prep.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.