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Volumn 71, Issue 5, 2000, Pages 571-576

Evaluation of structural and adhesive properties of nylon 6 and PTFE alignment films by means of atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROOPTICAL EFFECTS; FERROELECTRIC MATERIALS; LIQUID CRYSTAL POLYMERS; MORPHOLOGY; NYLON POLYMERS; OPTICAL CORRELATION; POLYIMIDES; POLYTETRAFLUOROETHYLENES; SUBSTRATES; SURFACE ROUGHNESS;

EID: 0034324448     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390000606     Document Type: Article
Times cited : (7)

References (14)
  • 4
    • 0343297758 scopus 로고    scopus 로고
    • U.S. Patent No. 5.180.470 (1993)
    • P. Smith, J.C. Wittmann: U.S. Patent No. 5.180.470 (1993)
    • Smith, P.1    Wittmann, J.C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.