Observations of carbon nanotube field emission failure in the transmission electron microscope

Materials Science Forum

Volumn 475-479, Issue V, 2005, Pages 4071-4076

  Wang, M S ^a   Wang, J Y ^a   Jin, C H ^b   Chen, Q ^a   Peng, L M ^a,b  

^a PEKING UNIVERSITY   (China)

^b Institute of Engineering Thermo physics   (China)

Author keywords

Carbon nanotube; Electron field emission; STM; TEM

Indexed keywords

DEGRADATION; ELECTRIC FIELDS; ELECTRON EMISSION; EVAPORATION; FAILURE ANALYSIS; MICROSCOPES; OXIDATION; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRIC FIELD EMISSION; EMISSION FAILURE; STRUCTURE DAMAGE; TRANSMISSION ELECTRON MICROSCOPE (TEM);

CARBON NANOTUBES;

EID: 17044377605     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-960-1.4071     Document Type: Conference Paper

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