SCOPUS 정보 검색 플랫폼

Volumn 3, Issue , 2004, Pages 145-150

Single-electron winner-take-all macro block for large-scale integrated neural networks

(3) Guimaraes J G a Nobrega L M a Da Costa, J C a

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT THEORY; COMPUTER SIMULATION; DIGITAL TO ANALOG CONVERSION; ELECTRIC POTENTIAL; FEATURE EXTRACTION; INTEGRATED CIRCUITS; NEURAL NETWORKS; ROBUSTNESS (CONTROL SYSTEMS); THERMAL EFFECTS; TRANSISTORS;

DATA INFORMATION; ELECTRICAL PEFORMANCE; HAMMING NETWORKS; WINNER-TAKE-ALL (WTA) NEURAL NETWORKS;

ELECTRONS;

EID: 17044375898 PISSN: None EISSN: None Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper

Times cited : (4)

References (10)

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2
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3
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- Hoekstra, J.¹ Da Costa, J.C.² Goossens, M.J.³ Verhoeven, C.J.M.⁴ Van Roermund, A.H.M.⁵

4
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- Prentice-Hall, New Jersey, USA
- L. Fausett, Fundamentals of Neural Networks, Prentice-Hall, New Jersey, USA (1994).
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- Fausett, L.¹

5
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6
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- Wasshuber, C.¹ Kosina, H.² Selberherr, S.³

7
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- Sao Paulo, Brazil
- J. G. Guimaraes and J. C. da Costa, in Proceedings of the 18th Symposium on Technology and Devices SBMICRO2003, p. 120, Sao Paulo, Brazil (2003).
- (2003) Proceedings of the 18th Symposium on Technology and Devices SBMICRO2003 , pp. 120
- Guimaraes, J.G.¹ Da Costa, J.C.²

8
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- J. G. Guimaraes, H. C. do Carmo, and J. C. da Costa, Microelectronics Journal, 35, 2 (2004).
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9
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- Likharev, K.K.¹

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