Microdiffraction study of polycrystalline copper during uniaxial tension deformation using a synchrotron X-ray source

Materials Science Forum

Volumn 475-479, Issue V, 2005, Pages 4149-4152

  Joo, H D ^a   Kim, J S ^a   Bark, C W ^a   Kim, J Y ^a   Koo, Y M ^a   Tamura, N ^b  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Local deformation; Microdiffraction; Polycrystal; Slip system; Tensile axis rotation

Indexed keywords

ANNEALING; CHARGE COUPLED DEVICES; DEFORMATION; LIGHT SOURCES; MICROSTRUCTURE; OXIDATION; POLYCRYSTALLINE MATERIALS; X RAY DIFFRACTION ANALYSIS;

LOCAL DEFORMATION; MICRODIFFRACTION; SLIP SYSTEM; TENSILE AXIS ROTATION; X-RAY SOURCES;

COPPER;

EID: 17044363200     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-960-1.4149     Document Type: Conference Paper

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