Thermal Transient Testing

Microelectronics International: An International Journal

Volumn 14, Issue 2, 1997, Pages 8-10

  Szekely V ^a   Rencz, M ^a   Courtois, B ^b  

^a BUDAPEST UNIVERSITY OF TECHNOLOGY AND ECONOMICS   (Hungary)

^b TIMA LABORATORY   (France)

Author keywords

Electronic packaging; Microelectronics; Testing; Thermal testing

Indexed keywords

EID: 16944367427     PISSN: 13565362     EISSN: None     Source Type: Journal    
DOI: 10.1108/13565369710800529     Document Type: Article

References (14)

1. Szekely, V.,Mairta, Cs.,Rencz, M.,Benedek, Zs.andCourtois, B,‘Design for Thermal Testability (DfTT) and a CMOS Realization’Sensors and Actuators,Vol. A55,No. I,pp. 29-33(1996.)
2. Szekely, V.,Mairta, Cs.,Rencz, M.,Benedek, Zs.andCourtois, B,‘A New Approach:Design for Thermal Testability (DfTT) of MCMs’., 2nd Multi-Chip Module Test Advanced Technology Workshop,Napa Valley, CA, USA,September (1995).
3. Pritchard, R. L. ‘Electrical Characteristics of Transistors’, Chapter 9 McGraw-Hill, New York (1967).
4. Siegel, B. S., Electronics, No. 51, p.121(1978)
5. Diebold, E. J. and Luft. W., ‘Transient thermal Impedance of Semiconductor Devices’, AIEE Transactions,Vol. 79,P. 719 (1961)
6. Newell, W. E., ‘Transient Thermal Analysis of Solid-state Power Devices— Making a Dreaded Process Easy’, PESC 1975 Record,p. 234 (1975)
7. Sofia, J. W., ‘Analysis of Thermal Transient Data with Synthesized Dynamic Models for Semiconductor Devices’,SEMITHERM '94, San Jose, CA, USA,pp.78-85, February (1994)
8. Oliveti, G., Piccirillo, A. and Bagnoli, P. E., ‘Analysis of Laser Diodes Thermal Properties with Spatial Resolution by means of T.R.A.I.T.Method’, Microelectronics Journal, Vol. 28, No. 3,pp.293-300(1997).
9. Székely, V.,‘On the Representation of Infinite-length Distributed RC One-ports’, IEEE Transactions on Circuits and Systems,Vol. CAS-38,No.7, pp. 711-719 (1991).
10. Kennett, T. J., Prestwich, W. V. and Robertson, A., ‘Bayesian Deconvolution I: Convergent Properties’, Nuclear Instruments and Methods, No. 151,pp. 285-292 (1978).
11. Székely, V., ‘Identification of RC Networks by Deconvolution: Chances and Limits’, submitted for publication to IEEE Transactions on Circuits and Systems.
12. Protonotarios, E. N. and Wing, O., ‘Theory of Nonuniform RC Lines, Part I’, IEEE Transactions on Circuit Theory, pp.2-12, March (1967).
13. Székely, V., ‘A New Evaluation Method of Thermal Transient Measurement Results’,Microelectronics Journal, Vol. 28, No. 3, pp. 277-292 (1997).
14. Székely, V, and van Bien, T.,‘Fine Structure of Heat Flow Path in Semiconductor Devices: A Measurement and Identification Method’, Solid State Electronics,Vol. 31,pp. 1363-1368 (1988).