Analysis of laser diode thermal properties with spatial resolution by means of the TRAIT method

Microelectronics Journal

Volumn 28, Issue 3, 1997, Pages 293-300

  Oliveti, G ^a   Piccirillo, A ^a   Bagnoli, P E ^b  

^a Ctro Studi Laboratori T   (Italy)

^b UNIVERSITY OF PISA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000185910     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2692(96)00032-8     Document Type: Article

References (12)

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