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Volumn 71, Issue 2, 2005, Pages

Interface proximity effects in current-perpendicular-to-plane magnetoresistance

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CALCULATION; DIFFUSION; ELECTRIC RESISTANCE; ELECTROCHEMISTRY; MAGNETIC FIELD; MODEL; PHENOMENOLOGY; RADIATION SCATTERING; STRUCTURE ANALYSIS; THICKNESS;

EID: 16844374777     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.71.024415     Document Type: Article
Times cited : (10)

References (23)
  • 4
    • 0000891697 scopus 로고
    • S. Zhang and P. M. Levy, J. Appl. Phys. 69, 4786 (1991); H. E. Camblong, S. Zhang, and P. M. Levy, Phys. Rev. B 47, 4735 (1993).
    • (1991) J. Appl. Phys. , vol.69 , pp. 4786
    • Zhang, S.1    Levy, P.M.2
  • 19
    • 16844384909 scopus 로고    scopus 로고
    • note
    • F/N describing spin asymmetry of the interface scattering.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.