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Volumn 38, Issue 2, 2005, Pages 299-305
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Perturbation method of analysis of crystal truncation rod data
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Author keywords
[No Author keywords available]
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Indexed keywords
ANALYTIC METHOD;
ARTICLE;
CALCULATION;
CRYSTAL;
CRYSTAL TRUNCATION ROD;
DATA ANALYSIS;
ELECTRON;
PROCESS MODEL;
SEMICONDUCTOR;
STRESS STRAIN RELATIONSHIP;
STRUCTURE ANALYSIS;
X RAY DIFFRACTION;
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EID: 16844371914
PISSN: 00218898
EISSN: None
Source Type: Journal
DOI: 10.1107/S0021889805000075 Document Type: Article |
Times cited : (11)
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References (14)
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