Aluminum thickness dependence of spatial profile in niobium-based superconducting tunnel junctions

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 520, Issue 1-3, 2004, Pages 260-262

  Ukibe, Masahiro ^a   Ikeuchi, Takashi ^b   Zama, Tatsuya ^a   Ohkubo, Masataka ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b MEIJI UNIVERSITY   (Japan)

Author keywords

Lift off; Spatial profile; Superconducting tunnel junctions; Synchrotron radiation; X ray; X ray spectroscopy

Indexed keywords

ALUMINUM; MAGNETIC FIELD EFFECTS; NIOBIUM; PHOTORESISTS; SYNCHROTRON RADIATION; TUNNEL JUNCTIONS; X RAY SPECTROSCOPY;

LIFT-OFF; SPATIAL PROFILE;

SUPERCONDUCTING DEVICES;

EID: 1642634499     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2003.11.339     Document Type: Conference Paper

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