메뉴 건너뛰기




Volumn 77, Issue 24, 2000, Pages 4055-4057

Experimental imaging diagnosis of superconducting tunnel junction x-ray detectors by low-temperature scanning synchrotron microscope

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000134064     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1331085     Document Type: Article
Times cited : (20)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.