Matched correlation sequence analysis in temporal speckle pattern interferometry

Optics and Laser Technology

Volumn 36, Issue 4, 2004, Pages 315-322

  Li, Xide ^a   Wang, Kai ^a   Deng, Bing ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

Deformation measurement; Harmonic vibration; Matched correlation; Phase shifting; Temporal speckle pattern interferometry

Indexed keywords

CALIBRATION; CHARGE COUPLED DEVICES; COMPUTATIONAL METHODS; NYQUIST DIAGRAMS; OPTICAL CORRELATION; PHASE SHIFTERS; PIEZOELECTRIC DEVICES; SPECKLE;

DEFORMATION MEASUREMENT; MATCHED CORRELATION; PHASE SHIFTING; TEMPORAL SPECKLE PATTERN INTERFEROMETRY;

INTERFEROMETRY;

EID: 1642617643     PISSN: 00303992     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optlastec.2003.09.015     Document Type: Article

References (17)

1. Rastogi PK, editor. Digital speckle pattern interferometry and related techniques. Chichester: Wiley; 2001.
2. Sirohi RS, editor. Speckle metrology. New York: Marcel Decker; 1993.
3. Robinson D.W., Williams D.C. Digital phase stepping speckle interferometry. Opt Commun. 57(1):1986;26-30.
4. Creath K. Phase-shifting speckle interferometry. Proc SPIE. 556:1985;337-346.
5. Nakadate S., Saito H. Fringe scanning speckle-pattern interferometry. Appl Opt. 24(14):1985;2172-2180.
6. Joenathan C., Franze B., Haible P., Tiziani H.J. Speckle interferometry with temporal phase evaluation for measuring large-object deformation. Appl Opt. 37(13):1998;2608-2614.
7. Tiziani H.J. Progress in temporal speckle modulation. Optik. 112(9):2001;370-380.
8. Vikhagen E. Nondestructive testing by use of TV holography and deformation phase gradient calculation. Appl Opt. 29(1):1990;137-144.
9. Wang J., Grant I. Electronic speckle interferometry, phase-mapping, and nondestructive testing techniques applied to real-time, thermal loading. Appl Opt. 34(19):1995;3620-3627.
10. Colonna de Lega X., Jacquot P. Deformation measurement with object-induced dynamic phase shifting. Appl Opt. 35(25):1996;5115-5121.
11. Li X., Yang Y., Tao G., Li R. Deformation measurement with temporal speckle pattern interferometry. Opt Eng. 40(2):2001;310-317.
12. Li X., Tao G., Yang Y. Continual deformation measurement with scanning phase method and time sequence phase method in temporal speckle pattern interferometry. Opt Laser Technol. 33(1):2001;53-59.
13. Masaaki A., Jon N.P., David K. Deformation-phase measurement of diffuse objects that have started nonrepeatable dynamic deformation. Appl Opt. 40(34):2001;6187-6192.
14. Li X., Soh A.K., Deng B., Guo X. High-precision large deflection measurements of thin films using time sequence speckle pattern interferometry. Meas Sci Technol. 13(8):2002;1304-1310.
15. Li X., Lin W., Wu X. Phase shifter automatic calibration with the same optical system in phase shifting interferometry. Acta Opt Sin. 14(9):1994;956-960.
16. Huntely J.M., Saldner H. Temporal phase-unwrapping algorithm for automated interferogram analysis. Appl Opt. 32(17):1993;3047-3052.
17. Li X., Gang Ta.o. Low-frequency harmonic vibration analysis with temporal speckle pattern interferometry. Opt Laser Technol. 34(3):2002;259-264.