Improved max-min scanning method for phase determination

Optical Engineering

Volumn 43, Issue 1, 2004, Pages 63-68

  Ding, Xu ^a   Cloud, Gary L ^a   Raju, Basavaraju B ^b  

^a Michigan State University   (United States)

^b US Army Tank Automotive Command   (United States)

Author keywords

Digital speckle pattern interferometry; Interferometry; Phase shifting algorithm

Indexed keywords

DIGITAL SPECKLE PATTERN INTERFEROMETRY; PHASE DETERMINATION; PHASE SHITING ALGORITHM;

ALGORITHMS; CURVE FITTING; IMAGE ANALYSIS; INTERFEROMETERS; OPTICAL RECORDING; PHASE MEASUREMENT; SIGNAL PROCESSING; SPECKLE; WAVEFORM ANALYSIS;

SCANNING;

EID: 1642587794     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.1625949     Document Type: Article

References (18)

1. K. Creath, "Phase-shifting speckle interferometry," Appl. Opt. 24(18), 3053-3058 (1985).
2. M. Sesselmann and A. A. Goncalves, Jr., "Single phase step algorithm for phase difference measurement using ESPI," Proc. SPIE 3478, 153-159 (July 1998).
3. J. Thesing, "New approaches for phase determination," Proc. SPIE 3478, 133-141 (July 1998).
4. H. Zhang, M. J. Lalor, and D. R. Burton, "A new error compensating seven sample phase shifting algorithm and application in 3-D fringe projection profilometry," Proc. SPIE 3478, 121-132 (July 1998).
5. C. L. Koliopoulos, "Phase shifting techniques applied to unique applications," Proc. SPIE 2861, 86-93 (1996).
6. K. Hibino, "Error-compensating phase measuring algorithms in a fizeau interferometer," Opt. Rev. 6(6), 529-538 (1999).
7. B. V. Dorrio and J. L. Fernandez, "Phase-evaluation methods in whole-field optics measurement techniques," Meas. Sci. Technol. 10(3), R33-R55 (1999).
8. Y. Surrel, "Fringe analysis," Top. Appl. Phys. 77, 55-102 (2000).
9. E. Vikhagen, "Nondestructive testing by use of TV holography and deformation phase gradient calculation," Appl. Opt. 29(1), 137-144 (1990).
10. X. Chen, M. Gramaglia, and J. A. Yeazell, "Phase-shifting interferometry with uncalibrated phase shifts," Appl. Opt. 39(4), 585-591 (2000).
11. J. Wang and L. Grant, "Electronic speckle interferometry phase mapping and nondestructive testing techniques applied to real-time, thermal loading," Appl. Opt. 34(3), 3620-3627 (1995).
12. G. L. Cloud, Optical Methods of Engineering Analysis, Cambridge University Press, New York (1995).
13. User Manual for LabVIEW, National Instruments Corporation, Austin, Texas (1998).
14. G. H. Kaufmann, P. D. Ruiz, and G. E. Galizzi, "Unwrapping of digital speckle pattern interferometry phase maps using a minimum L-norm algorithm," Proc. SPIE 3478, 170-180 (July 1998).
15. G. L. Cloud, X. Ding, and B. B. Raju, "Real-time digital speckle interferometry to measure crack length," Exper. Tech. 26(1), 19-21 (2002).
16. G. L. Cloud, "Practical speckle interferometry for measuring in-plane deformations," Appl. Opt. 14(4), 878-884 (1979).
17. P. L. Ransom and J. V. Kokal, "Interferogram analysis by a modified sinusoid fitting technique," Appl. Opt. 25(22), 4199-4204 (1986).
18. W. W. Macy, Jr. and J. Bokor, "Two-dimensional fringe-pattern analysis," Appl. Opt. 22(23), 3898-3901 (1983).