Single phase-step algorithm for phase difference measurement using ESPI

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3478, Issue , 1998, Pages 153-159

  Sesselmann, Meinhard ^a   Gonçalves Jr , Armando Albertazzi ^a  

^a FEDERAL UNIVERSITY OF SANTA CATARINA   (Brazil)

Author keywords

ESPI; Phase shifting; Speckle interferometry

Indexed keywords

DEFORMATION; INTERFEROMETERS; INTERFEROMETRY; SPECKLE;

DEFORMATION STATES; ESPI; IMAGING SENSORS; INTERFERENCE TERMS; INTERFEROGRAMS; MEASUREMENT UNCERTAINTIES; NEW ALGORITHMS; PHASE DIFFERENCE MEASUREMENTS; PHASE SIGNALS; PHASE STEPS; PHASE-SHIFTING; SPECKLE INTERFEROMETRY; STEP ALGORITHMS;

UNCERTAINTY ANALYSIS;

EID: 0004872315     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.312932     Document Type: Conference Paper

References (5)

1. D.W.Robinson, G. T Reid, "Interferogram Analysis, Digital Fringe Pattern Measurement Techniques," and references therein, Institute of Physics Publishing, Bristol, (1993)
2. A.Albertazzi Jr., "Generalized least squares approach to compute displacement, strains and rotation from combined single and/or double illumination holographic interferometr," SPIE vol. 2004, 80-89, San Diego (1993)
3. A. J. Moore, J. R. Tyrer, F. M. Santoyo, "Phase extraction from electronic speckle pattern interferometry addition fringes," and references therein, Appl. Opt. 33, No. 31, 7312-7320 (1994)
4. C. S. Vikram, W. K. Witherow, and J. D. Trolinger, "Algorithm for phase-difference measurement in phase-shifting interferometry," Appl. Opt. 32, No 31, 6250-6252 (1993)
5. D. Kerr, F. M. Santoyo, and J. R. Tyrer, "Extraction ofphase data from electronic speckle pattern interferometric fringes using a single-phase-step method: a novel approach," J. Opt. Soc. Am. A 7, No. 5,820-826 (1990)