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Volumn 37, Issue 3 SUPPL. B, 1998, Pages 1427-1431

Highly reliable operation of InGaAlAs waveguide photodiodes for optical access network systems

Author keywords

Aging test; Carrier accumulation; Lifetime; Optical access network; Passivation; Reliability; Waveguide photodiode

Indexed keywords

EID: 1642522328 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.37.1427 Document Type: Article

Times cited : (6)

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