Nanoanalysis by a High-Resolution Energy Filtering Transmission Electron Microscope

Microscopy Research and Technique

Volumn 63, Issue 3, 2004, Pages 140-148

  Mitome, Masanori ^a   Bando, Yoshio ^a   Golberg, Dmitri ^a   Kurashima, Keiji ^a   Okura, Yoshihiro ^b   Kaneyama, Toshikatsu ^b   Naruse, Mikio ^b   Honda, Yoshiaki ^c  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b JEOL LTD   (Japan)

^c EISAI CO LTD   (Japan)

Author keywords

Electron energy loss spectroscopy; Elemental analysis

Indexed keywords

ELECTRON SCATTERING; ENERGY DISSIPATION; IMAGE ENHANCEMENT; SURFACE PLASMONS; TRANSMISSION ELECTRON MICROSCOPY;

ACCELERATION VOLTAGES; ELECTRON ENERGY-LOSS SPECTROSCOPIES; ELEMENTAL DISTRIBUTION; ENERGY FILTERING; HIGH RESOLUTION; PLASMON-LOSS; SILVER PARTICLES; SPATIAL RESOLUTION; SURFACE-PLASMON; TRANSMISSION ELECTRON;

ELECTRON ENERGY LOSS SPECTROSCOPY;

ALUMINUM DERIVATIVE; NITROGEN DERIVATIVE; OXYGEN;

ARTICLE; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY; IMAGE ANALYSIS; IMAGE QUALITY; PRIORITY JOURNAL; SENSITIVITY AND SPECIFICITY; SURFACE PLASMON RESONANCE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 1642498157     PISSN: 1059910X     EISSN: None     Source Type: Journal    
DOI: 10.1002/jemt.20025     Document Type: Article

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