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Volumn 17, Issue 4, 2003, Pages 509-525

Bounds for the distribution of two-dimensional binary scan statistics

Author keywords

[No Author keywords available]

Indexed keywords

DISTRIBUTION FUNCTIONS;

EID: 1642492008     PISSN: 02699648     EISSN: None     Source Type: Journal    
DOI: 10.1017/S0269964803174062     Document Type: Article
Times cited : (9)

References (10)
  • 1
    • 0035478874 scopus 로고    scopus 로고
    • Reliability of a two-dimensional k-within-consecutive-r × s-out-of-m × n:F system
    • Akiba, T. & Yamamoto, H. (2001). Reliability of a two-dimensional k-within-consecutive-r × s-out-of-m × n:F system. Naval Research Logistics 48: 625-637.
    • (2001) Naval Research Logistics , vol.48 , pp. 625-637
    • Akiba, T.1    Yamamoto, H.2
  • 3
    • 0034337846 scopus 로고    scopus 로고
    • Generalized reliability bounds for coherent structures
    • Boutsikas, M.V. & Koutras, M.V. (2000). Generalized reliability bounds for coherent structures. Journal of Applied Probability 37: 778-794.
    • (2000) Journal of Applied Probability , vol.37 , pp. 778-794
    • Boutsikas, M.V.1    Koutras, M.V.2
  • 6
    • 84946648904 scopus 로고
    • Coherent structures of non-identical components
    • Esary, J.D. & Proschan, F. (1963). Coherent structures of non-identical components. Technometrics 5: 191-209.
    • (1963) Technometrics , vol.5 , pp. 191-209
    • Esary, J.D.1    Proschan, F.2
  • 7
    • 0000140979 scopus 로고
    • Reliability bounds for coherent structures with independent components
    • Fu, J.C. & Koutras, M.V. (1995). Reliability bounds for coherent structures with independent components. Statistics and Probability Letters 22: 137-148.
    • (1995) Statistics and Probability Letters , vol.22 , pp. 137-148
    • Fu, J.C.1    Koutras, M.V.2
  • 9
    • 0031206719 scopus 로고    scopus 로고
    • Bounds for reliability of k-within 2-dimensional consecutive-r-out-of-n failure systems
    • Makri, F.S. & Psillakis, Z.M. (1997). Bounds for reliability of k-within 2-dimensional consecutive-r-out-of-n failure systems. Microelectronics and Reliability 37: 1217-1224.
    • (1997) Microelectronics and Reliability , vol.37 , pp. 1217-1224
    • Makri, F.S.1    Psillakis, Z.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.