Bounds for reliability of k-within connected-(r, s)-out-of-(m, n) failure systems

Microelectronics Reliability

Volumn 37, Issue 8, 1997, Pages 1217-1224

  Makri, F S ^a   Psillakis, Z M ^a  

^a UNIVERSITY OF PATRAS   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL MODELS; MATRIX ALGEBRA; RELIABILITY; STATISTICAL METHODS;

FAILURE SYSTEMS;

FAILURE ANALYSIS;

EID: 0031206719     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(96)00289-2     Document Type: Article

References (11)

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