Nanostructured films from (C 60 ) n Si m clusters

Applied Surface Science

Volumn 226, Issue 1-3 SPEC. ISS., 2004, Pages 226-230

  Masenelli, B ^a   Tournus, F ^a   Melinon P ^a   Blase, X ^a   Perez, A ^a   Pellarin, M ^a   Broyer, M ^a  

^a UNIVERSITÉ LYON 1   (France)

Author keywords

Clusters; DFT calculations; EXAFS; Fullerenes; Silicon

Indexed keywords

ABSORPTION; APPROXIMATION THEORY; FULLERENES; NANOSTRUCTURED MATERIALS; PROBABILITY DENSITY FUNCTION; RAMAN SPECTROSCOPY; RELAXATION PROCESSES; THIN FILMS; VAN DER WAALS FORCES; VAPORIZATION; X RAY ANALYSIS;

CLUSTERS; DFT CALCULATIONS; EXAFS;

SILICON COMPOUNDS;

EID: 1642483753     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2003.11.024     Document Type: Conference Paper

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