Design, characterization and modelling of a CMOS magnetic field sensor

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 1999, Pages 239-243

  Latorre, L ^a,b   Bertrand, Y ^a   Hazard, P ^c   Pressecq, F ^b   Nouet, P ^a  

^a CNRS   (France)

^b CNES   (France)

^c SCHNEIDER ELECTRIC   (France)

Author keywords

[No Author keywords available]

Indexed keywords

HALL-EFFECT SENSORS; MAGNETIC FIELD SENSORS;

EXHIBITIONS; MAGNETIC SENSORS; MAGNETOMETERS;

DESIGN;

EID: 1642456870     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.1999.761128     Document Type: Conference Paper

References (8)

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3. Information is available on the World Wide Web at the following address: http://tima-cmp.imag.fr/tima/mcs/mcs.html
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5. C.S. Roumenin, "Magnetic sensors continue to advance towards perfection", Sensors and Actuators A, Vol 46-47, pp. 273-279, 1995
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7. S.P. Timoshenko, "Strength of Materials", D. Van Nostrand Inc., Princeton New Jersey, 1968.
8. L. Latorre, Y. Bertrand, P. Nouet, "On the use of Test Structures for the Electromechanical characterization of a CMOS compatible MEMS technology", Proc. IEEE 1998 Int. Conf. On Microelectronic Test Structures, March, 1998.