-
2
-
-
0039579885
-
-
Uhl, W.; Layh, M.; Hiller, W. J. Organomet. Chem. 1989, 368, 139.
-
(1989)
J. Organomet. Chem.
, vol.368
, pp. 139
-
-
Uhl, W.1
Layh, M.2
Hiller, W.3
-
3
-
-
0041163319
-
-
Uhl, W.; Graupner, R.; Pohl, S.; Saak, W.; Hiller, W.; Neumayer, M. Z. Anorg. Allg. Chem. 1997, 623, 883.
-
(1997)
Z. Anorg. Allg. Chem.
, vol.623
, pp. 883
-
-
Uhl, W.1
Graupner, R.2
Pohl, S.3
Saak, W.4
Hiller, W.5
Neumayer, M.6
-
4
-
-
0001001146
-
-
Uhl, W.; Layh, M.; Hildenbrand, T. J. Organomet. Chem. 1989, 364, 289.
-
(1989)
J. Organomet. Chem.
, vol.364
, pp. 289
-
-
Uhl, W.1
Layh, M.2
Hildenbrand, T.3
-
5
-
-
0001111201
-
-
Uhl, W.; Hahn, I.; Reuter, H. Chem. Ber. 1996, 129, 1425.
-
(1996)
Chem. Ber.
, vol.129
, pp. 1425
-
-
Uhl, W.1
Hahn, I.2
Reuter, H.3
-
6
-
-
33748509515
-
-
Uhl, W.; Spies, T.; Koch, R. J. Chem. Soc., Dalton Trans. 1999, 2385.
-
(1999)
J. Chem. Soc., Dalton Trans.
, pp. 2385
-
-
Uhl, W.1
Spies, T.2
Koch, R.3
-
8
-
-
0001056642
-
-
(a) Uhl, W.; Spies, T.; Haase, D.; Winter, R.; Kaim, W. Organometallics 2000, 19, 1128.
-
(2000)
Organometallics
, vol.19
, pp. 1128
-
-
Uhl, W.1
Spies, T.2
Haase, D.3
Winter, R.4
Kaim, W.5
-
9
-
-
0037088217
-
-
(b) Uhl, W.; Cuypers, L.; Prött, M.; Harms, K. Polyhedron 2002, 21, 511.
-
(2002)
Polyhedron
, vol.21
, pp. 511
-
-
Uhl, W.1
Cuypers, L.2
Prött, M.3
Harms, K.4
-
10
-
-
0000259615
-
-
(a) Keys, A.; Bott, S. G.; Barron, A. R. Polyhedron 1998, 17, 3121.
-
(1998)
Polyhedron
, vol.17
, pp. 3121
-
-
Keys, A.1
Bott, S.G.2
Barron, A.R.3
-
11
-
-
0003154815
-
-
(b) Keys, A.; Barbarich, T. J.; Bott, S. G.; Barron, A. R. J. Chem. Soc., Dalton Trans. 2000, 577.
-
(2000)
J. Chem. Soc., Dalton Trans.
, pp. 577
-
-
Keys, A.1
Barbarich, T.J.2
Bott, S.G.3
Barron, A.R.4
-
12
-
-
0034743858
-
-
Branch, C. S.; Lewinski, J.; Justyniak, I.; Bott, S. G.; Lipkowski, J.; Barron, A. R. J. Chem. Soc., Dalton Trans. 2001, 1253.
-
(2001)
J. Chem. Soc., Dalton Trans.
, pp. 1253
-
-
Branch, C.S.1
Lewinski, J.2
Justyniak, I.3
Bott, S.G.4
Lipkowski, J.5
Barron, A.R.6
-
13
-
-
0037170083
-
-
(a) Hatop, H.; Ferbinteanu, M.; Roesky, H. W.; Cimpoesu, F.; Schiefer, M.; Schmidt, H.-G.; Noltemeyer, M. Inorg. Chem. 2002, 41, 1022.
-
(2002)
Inorg. Chem.
, vol.41
, pp. 1022
-
-
Hatop, H.1
Ferbinteanu, M.2
Roesky, H.W.3
Cimpoesu, F.4
Schiefer, M.5
Schmidt, H.-G.6
Noltemeyer, M.7
-
15
-
-
0001004373
-
-
(c) Pietrzykowski, A.; Pasynkiewicz, S.; Poplawska, J. Main Group Met. Chem. 1995, 18, 651.
-
(1995)
Main Group Met. Chem.
, vol.18
, pp. 651
-
-
Pietrzykowski, A.1
Pasynkiewicz, S.2
Poplawska, J.3
-
16
-
-
0000171355
-
-
Bethley, Ch. E.; Aitken, C. L.; Harlan, C. J.; Koide, Y.; Bott, S. G.; Barron, A. R. Organometallics 1997, 16, 329.
-
(1997)
Organometallics
, vol.16
, pp. 329
-
-
Bethley, Ch.E.1
Aitken, C.L.2
Harlan, C.J.3
Koide, Y.4
Bott, S.G.5
Barron, A.R.6
-
17
-
-
0001423666
-
-
Uhl, W.; Hahn, I.; Wartchow, R. Chem. Ber. 1997, 130, 417.
-
(1997)
Chem. Ber.
, vol.130
, pp. 417
-
-
Uhl, W.1
Hahn, I.2
Wartchow, R.3
-
18
-
-
0031484918
-
-
Uhl, W.; Graupner, R.; Hahn, I. Z. Anorg. Allg. Chem. 1997, 623, 565.
-
(1997)
Z. Anorg. Allg. Chem.
, vol.623
, pp. 565
-
-
Uhl, W.1
Graupner, R.2
Hahn, I.3
-
19
-
-
0004150157
-
-
Siemens Analytical X-Ray Instruments Inc.: Madison, WI
-
SHELXTL-Plus, REL. 4.1; Siemens Analytical X-Ray Instruments Inc.: Madison, WI, 1990.
-
(1990)
SHELXTL-Plus, REL. 4.1
-
-
|