Novel white-light interferometer using an electronically scanned Mach-Zehnder interferometer

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2594, Issue , 1996, Pages 159-167

  Marshall, Raymond H ^a   Ning, Yanong N ^a   Jiang, X Q ^a   Palmer, Andrew W ^a   Meggitt, B T ^a   Grattan, Kenneth T ^a  

^a CITY UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICAL SCANNING; MACH-ZEHNDER INTERFEROMETER; WHITE LIGHT INTERFEROMETERS;

MATHEMATICAL MODELS; MIRRORS; OPTICAL BEAM SPLITTERS; OPTICAL SENSORS; OPTICAL VARIABLES MEASUREMENT;

INTERFEROMETERS;

EID: 0029779399     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)