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Volumn 33, Issue 1, 2001, Pages 16-28

Bayesian inference for some mixture problems in quality and reliability

Author keywords

Bayesian Methods; Likelihood; Manufacturing; Posterior Distributions; Quality Control; Reliability

Indexed keywords


EID: 1642315569     PISSN: 00224065     EISSN: None     Source Type: Journal    
DOI: 10.1080/00224065.2001.11980044     Document Type: Article
Times cited : (20)

References (20)
  • 3
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    • CHAMBERS, J. M. and HASTIE, T. J. (1992). Statistical Models in S. Wadsworth & Brooks/Cole Advanced Books & Software, Pacific Grove, CA.
    • (1992) Statistical Models in S
    • Chambers, J.M.1    Hastie, T.J.2
  • 4
    • 32344446687 scopus 로고
    • Understanding the metropolis-hastings algorithm
    • CHIB, S. and GREENBERG E. (1995). "Understanding the Metropolis-Hastings Algorithm". The American Statistician 49, pp. 327-335.
    • (1995) The American Statistician , vol.49 , pp. 327-335
    • Chib, S.1    Greenberg, E.2
  • 5
    • 0025433611 scopus 로고
    • The use and evaluation of yield models in integrated circuit manufacturing
    • CUNNINGHAM, J. A. (1990). "The Use and Evaluation of Yield Models in Integrated Circuit Manufacturing". IEEE Transactions on Semiconductor Manufacturing 3, pp. 60-71.
    • (1990) IEEE Transactions on Semiconductor Manufacturing , vol.3 , pp. 60-71
    • Cunningham, J.A.1
  • 6
    • 0002629270 scopus 로고
    • Maximum likelihood estimation from incomplete data via the EM algorithm
    • DEMPSTER, A. P.; LAIRD, N. M.; and RUBIN, D. B. (1977). "Maximum Likelihood Estimation from Incomplete Data Via the EM Algorithm (with Discussion)". Journal of the Royal Statistical Society B 39, pp. 1-38.
    • (1977) Journal of the Royal Statistical Society B , vol.39 , pp. 1-38
    • Dempster, A.P.1    Laird, N.M.2    Rubin, D.B.3
  • 10
    • 0026821975 scopus 로고
    • Zero-inflated poisson regression, with an application to defects in manufacturing
    • LAMBERT, D. (1992). "Zero-Inflated Poisson Regression, With an Application to Defects in Manufacturing". Technometrics 34, pp. 1-14.
    • (1992) Technometrics , vol.34 , pp. 1-14
    • Lambert, D.1
  • 12
    • 0023288393 scopus 로고
    • Limited failure population life tests: Application to integrated circuit reliability
    • MEEKER, W. Q. (1987). "Limited Failure Population Life Tests: Application to Integrated Circuit Reliability". Technometrics 29, pp. 51-65.
    • (1987) Technometrics , vol.29 , pp. 51-65
    • Meeker, W.Q.1
  • 15
    • 0023532708 scopus 로고
    • A comparison of maximum likelihood and Bayesian estimators for the three-parameter weibull distribution
    • SMITH, R. L. and NAYLOR, J. C. (1987). "A Comparison of Maximum Likelihood and Bayesian Estimators for the Three-parameter Weibull Distribution". Applied Statistics 30, pp. 358-369.
    • (1987) Applied Statistics , vol.30 , pp. 358-369
    • Smith, R.L.1    Naylor, J.C.2
  • 18
    • 0000486814 scopus 로고
    • Updating a diagnostic system using unconfirmed cases
    • TITTERINGTON, D. M. (1976). "Updating A Diagnostic System Using Unconfirmed Cases". Applied Statistics 25, pp. 238-247.
    • (1976) Applied Statistics , vol.25 , pp. 238-247
    • Titterington, D.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.