-
1
-
-
0141477361
-
Bayesian computation and stochastic systems
-
BESAG, J.; PETER, G.; DAVID, H.; and KERRIE, M. (1995). "Bayesian Computation and Stochastic Systems", Statistical Science 10, pp. 3-66.
-
(1995)
Statistical Science
, vol.10
, pp. 3-66
-
-
Besag, J.1
Peter, G.2
David, H.3
Kerrie, M.4
-
3
-
-
0004269485
-
-
Wadsworth & Brooks/Cole Advanced Books & Software, Pacific Grove, CA
-
CHAMBERS, J. M. and HASTIE, T. J. (1992). Statistical Models in S. Wadsworth & Brooks/Cole Advanced Books & Software, Pacific Grove, CA.
-
(1992)
Statistical Models in S
-
-
Chambers, J.M.1
Hastie, T.J.2
-
4
-
-
32344446687
-
Understanding the metropolis-hastings algorithm
-
CHIB, S. and GREENBERG E. (1995). "Understanding the Metropolis-Hastings Algorithm". The American Statistician 49, pp. 327-335.
-
(1995)
The American Statistician
, vol.49
, pp. 327-335
-
-
Chib, S.1
Greenberg, E.2
-
5
-
-
0025433611
-
The use and evaluation of yield models in integrated circuit manufacturing
-
CUNNINGHAM, J. A. (1990). "The Use and Evaluation of Yield Models in Integrated Circuit Manufacturing". IEEE Transactions on Semiconductor Manufacturing 3, pp. 60-71.
-
(1990)
IEEE Transactions on Semiconductor Manufacturing
, vol.3
, pp. 60-71
-
-
Cunningham, J.A.1
-
8
-
-
0031199871
-
Model-free estimation of defect clustering in integrated circuit fabrication
-
FRIEDMAN, D. J.; HANSEN, M. H.; NAIR V. N.; and JAMES, D. (1997). "Model-Free Estimation of Defect Clustering in Integrated Circuit Fabrication". IEEE Transactions on Semiconductor Manufacturing 10, pp. 344-359.
-
(1997)
IEEE Transactions on Semiconductor Manufacturing
, vol.10
, pp. 344-359
-
-
Friedman, D.J.1
Hansen, M.H.2
Nair, V.N.3
James, D.4
-
10
-
-
0026821975
-
Zero-inflated poisson regression, with an application to defects in manufacturing
-
LAMBERT, D. (1992). "Zero-Inflated Poisson Regression, With an Application to Defects in Manufacturing". Technometrics 34, pp. 1-14.
-
(1992)
Technometrics
, vol.34
, pp. 1-14
-
-
Lambert, D.1
-
12
-
-
0023288393
-
Limited failure population life tests: Application to integrated circuit reliability
-
MEEKER, W. Q. (1987). "Limited Failure Population Life Tests: Application to Integrated Circuit Reliability". Technometrics 29, pp. 51-65.
-
(1987)
Technometrics
, vol.29
, pp. 51-65
-
-
Meeker, W.Q.1
-
15
-
-
0023532708
-
A comparison of maximum likelihood and Bayesian estimators for the three-parameter weibull distribution
-
SMITH, R. L. and NAYLOR, J. C. (1987). "A Comparison of Maximum Likelihood and Bayesian Estimators for the Three-parameter Weibull Distribution". Applied Statistics 30, pp. 358-369.
-
(1987)
Applied Statistics
, vol.30
, pp. 358-369
-
-
Smith, R.L.1
Naylor, J.C.2
-
18
-
-
0000486814
-
Updating a diagnostic system using unconfirmed cases
-
TITTERINGTON, D. M. (1976). "Updating A Diagnostic System Using Unconfirmed Cases". Applied Statistics 25, pp. 238-247.
-
(1976)
Applied Statistics
, vol.25
, pp. 238-247
-
-
Titterington, D.M.1
-
19
-
-
0003747605
-
-
John Wiley & Sons, Toronto, Ontario, CAN
-
TITTERINGTON, D. M.; SMITH, A. F. M.; and MAKOV, U. E. (1985). Statistical Analysis of Finite Mixture Distributions. John Wiley & Sons, Toronto, Ontario, CAN.
-
(1985)
Statistical Analysis of Finite Mixture Distributions
-
-
Titterington, D.M.1
Smith, A.F.M.2
Makov, U.E.3
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