Carbon depth profiling of superconducting YBCO thin films on nanometer scale

Current Applied Physics

Volumn 4, Issue 2-4, 2004, Pages 292-295

  Kennedy, V J ^a,b   Markwitz, A ^a,b   Bubendorfer, A ^c   Long, N ^c   Dytlewski, N ^d  

^a GNS SCIENCE   (New Zealand)

^b VICTORIA UNIVERSITY OF WELLINGTON   (New Zealand)

^c CALLAGHAN INNOVATION   (New Zealand)

^d AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

Author keywords

HERDA TOF; High Tc superconductors; NRA; Thin films; YBCO films

Indexed keywords

EID: 1642293428     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2003.11.031     Document Type: Article

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