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Volumn 71, Issue 8, 2005, Pages

Charge injection into cathode-doped amorphous organic semiconductors

Author keywords

[No Author keywords available]

Indexed keywords

METAL;

EID: 16344366044     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.71.085207     Document Type: Article
Times cited : (63)

References (27)
  • 23
    • 16344383988 scopus 로고    scopus 로고
    • note
    • 3 C 1s orbital is observed by Kahn et al. to broaden from 2.5 eV (FWHM) far from the interface to 3 eV (FWHM) at the interface. This is consistent with a convolution with a Gaussian with standard deviation of approximately 0.7 eV.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.