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Volumn 29 PART 4, Issue , 1996, Pages 341-345

Early Finding of Preferred Orientation: Applications to Direct Methods

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000278546     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/s0021889896000271     Document Type: Article
Times cited : (16)

References (16)
  • 3
    • 0003893312 scopus 로고
    • Institut für Kristallographie und Petrographie, ETH, Zürich, Switzerland
    • Baerlocher, Ch. (1982). XRS-82: The X-ray Rietveld System. Institut für Kristallographie und Petrographie, ETH, Zürich, Switzerland.
    • (1982) XRS-82: The X-ray Rietveld System
    • Baerlocher, Ch.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.