Exploring the combination of I/sub DDQ/ and i/sub DDt/ testing: Energy testing

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 1999, Pages 543-548

  Rius, Josep ^a   Figueras, Joan ^a  

^a UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS CIRCUITS; CUSTOM CIRCUITS; DEFECT-FREE; DEFECTIVE CIRCUITS; ENERGY SIGNATURES;

CMOS INTEGRATED CIRCUITS;

EXHIBITIONS;

EID: 16244395601     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.1999.761180     Document Type: Conference Paper

References (12)

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