Banked scratch-pad memory management for reducing leakage energy consumption

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

Volumn , Issue , 2004, Pages 120-124

  Kandemir, M ^a   Irwin, M J ^a   Chen, G ^a   Kolcu, I ^b  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

Leakage energy; Scratch Pad Memory (SPM)

Indexed keywords

BUFFER STORAGE; CMOS INTEGRATED CIRCUITS; COMPUTER SOFTWARE; ENERGY EFFICIENCY; ENERGY UTILIZATION; OPTIMIZATION; PROGRAM COMPILERS;

DATA MAPPING; EXECUTION CYCLES; LEAKAGE ENERGY; SCRATCH-PAD MEMORIES (SPM);

LOGIC CIRCUITS;

EID: 16244366467     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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