Contribution of 3D atom probe to the understanding of plane-by-plane AP analyses data: Application to the study of ordering in Cu 3 Au

Applied Surface Science

Volumn 94-95, Issue , 1996, Pages 449-456

  Duval, S ^a   Chambreland, S ^a   Deconihout, B ^a  

^a UNIVERSITÉ DE ROUEN   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; COPPER ALLOYS; DETECTORS; ION MICROSCOPES; PROBES; TEMPERATURE; THREE DIMENSIONAL;

ARTEFACTS; CONVENTIONAL ATOM PROBE; FIELD EVAPORATION BEHAVIOR; ORDERING PHENOMENA; PILE UP EFFECTS; PLANE BY PLANE ANALYSIS; POSITION SENSITIVE DETECTOR; PREFERENTIAL RETENTION; TOMOGRAPHIC ATOM PROBE;

OPTICAL INSTRUMENTS;

EID: 0030562841     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-4332(95)00409-2     Document Type: Article

References (12)

1. D. Blavette and A. Bostel, Acta Met. 32 (1984) 811.
2. M.K. Miller and J.A. Horton, Scr. Met. 20 (1986) 1125.
3. M.K. Miller, J. Microsc. 147 (1987) 159.
4. A.R. Waugh, E.D. Boyes and M.J. Southern, Surf. Sci. 61 (1976) 109.
5. A.J.W. Moore, Phil. Mag. 43 (1981) 803.
6. D. Blavette, B. Deconihout, A. Bostel, J.M. Sarrau, M. Bouet and A. Menand, Rev. Sci. Instr. 64 (1993) 2911.
7. B. Deconihout, A. Bostel, M. Bouet, J.M. Sarrau, P. Bas and D. Blavette, Appl. Surf. Sci. 87/88 (1995) 428.
8. P. Bas, A. Bostel, B. Deconihout and D. Blavette, Appl. Surf. Sci. 87/88 (1995) 298.
9. V.A. Ivchenko and N.N. Syutkin, Phys. Met. Metall. 61 (1986) 3.
10. M. Wada, R. Uemori and O. Nishikawa, Surf. Sci. 134 (1983) 17.
11. P. Bas, A. Bostel, G. Grancher, B. Deconihout and D. Blavette, Appl. Surf. Sci. 94/95 (1996) 442.
12. R.F. Shannon, Jr., S.E. Nagler, C.R. Harkless and R.M. Nicklow, Phys. Rev. B 46 (1992) 40.