-
1
-
-
0011647629
-
-
(Academic, New York), Chap. IV
-
R. Kingslake, ed., Applied Optics and Optical Engineering (Academic, New York, 1965), Vol. 1, Chap. IV, p. 208.
-
(1965)
Applied Optics and Optical Engineering
, vol.1
, pp. 208
-
-
Kingslake, R.1
-
2
-
-
84975542839
-
Determination of the focal length of nonparaxial lenses by Moiré deflectometry
-
I. Geatt and O. Kafri, "Determination of the focal length of nonparaxial lenses by Moiré deflectometry," Appl. Opt. 26, 2507-2508 (1987).
-
(1987)
Appl. Opt.
, vol.26
, pp. 2507-2508
-
-
Geatt, I.1
Kafri, O.2
-
3
-
-
84975597860
-
Universal method for determining the focal length of optical systems by moiré deflectometry
-
E. Keren, M. K. Kreske, and O. Kafri, "Universal method for determining the focal length of optical systems by moiré deflectometry," Appl. Opt. 27, 1383-1385 (1988).
-
(1988)
Appl. Opt.
, vol.27
, pp. 1383-1385
-
-
Keren, E.1
Kreske, M.K.2
Kafri, O.3
-
4
-
-
0030394525
-
Reflective grating interferometer for measuring the focal length of lens by digital moiré effect
-
S. D. Nicola, P. Ferraro, A. Finizio, and G. Pierattin, "Reflective grating interferometer for measuring the focal length of lens by digital moiré effect," Opt. Commun. 132, 432-436 (1996).
-
(1996)
Opt. Commun.
, vol.132
, pp. 432-436
-
-
Nicola, S.D.1
Ferraro, P.2
Finizio, A.3
Pierattin, G.4
-
5
-
-
84975655402
-
Talbot interferometry for measuring the focal length of a lens
-
Y. Nakano and K. Murata, "Talbot interferometry for measuring the focal length of a lens," Appl. Opt. 24, 3162-3166 (1985).
-
(1985)
Appl. Opt.
, vol.24
, pp. 3162-3166
-
-
Nakano, Y.1
Murata, K.2
-
6
-
-
84975598436
-
Evaluation of the focal distance of a lens by Talbot interferometry
-
L. M. Bernardo and O. D. D. Soares, "Evaluation of the focal distance of a lens by Talbot interferometry," Appl. Opt. 27, 296-301 (1988).
-
(1988)
Appl. Opt.
, vol.27
, pp. 296-301
-
-
Bernardo, L.M.1
Soares, O.D.D.2
-
7
-
-
0001031390
-
Direct determination of focal length by using Talbot interferometry
-
K. V. Sriram, M. P. Kothiyal, and R. S. Sirohi, "Direct determination of focal length by using Talbot interferometry," Appl. Opt. 31, 5984-5987 (1992).
-
(1992)
Appl. Opt.
, vol.31
, pp. 5984-5987
-
-
Sriram, K.V.1
Kothiyal, M.P.2
Sirohi, R.S.3
-
8
-
-
15744384096
-
Talbot interferometry and its applications
-
Chaudhary Charan Singh University, Meerut, India, 4-6 April
-
C. Shakher, "Talbot interferometry and its applications, presented at the National Symposium on Perspectives in Engineering Optics," Chaudhary Charan Singh University, Meerut, India, 4-6 April 2003.
-
(2003)
National Symposium on Perspectives in Engineering Optics
-
-
Shakher, C.1
-
9
-
-
84894011149
-
Surface profiling using phase shifting Talbot interferometric technique
-
to be published
-
S. Mirza and C. Shakher, "Surface profiling using phase shifting Talbot interferometric technique," Opt. Eng., to be published.
-
Opt. Eng.
-
-
Mirza, S.1
Shakher, C.2
-
10
-
-
0032661548
-
Phase stepping in Lau interferometry
-
L. Angel, M. Tenaldi, and R. Henao, "Phase stepping in Lau interferometry," Opt. Commun. 164, 247-255 (1999).
-
(1999)
Opt. Commun.
, vol.164
, pp. 247-255
-
-
Angel, L.1
Tenaldi, M.2
Henao, R.3
-
11
-
-
0036543109
-
Evaluation of the focal distance of lenses by white-light Lau phase interferometry
-
M. Thakur and C. Shakher, "Evaluation of the focal distance of lenses by white-light Lau phase interferometry," Appl. Opt. 41, 1841-1845 (2002).
-
(2002)
Appl. Opt.
, vol.41
, pp. 1841-1845
-
-
Thakur, M.1
Shakher, C.2
-
12
-
-
0001418962
-
Phase shifting interferometers
-
(Wiley, New York), Chap. 14
-
D. Malacara, ed., "Phase shifting interferometers," in Optical Shop Testing, 2nd ed. (Wiley, New York, 1992), Vol. 2, Chap. 14, p. 23.
-
(1992)
Optical Shop Testing, 2nd Ed.
, vol.2
, pp. 23
-
-
Malacara, D.1
-
13
-
-
0002238066
-
Improved phase-shifting method for automatic processing of moiré deflecto-grams
-
H. Canabal, J. A. Quigoga, and E. Bernabeu, "Improved phase-shifting method for automatic processing of moiré deflecto-grams," Appl. Opt. 37, 6227-6233 (1998).
-
(1998)
Appl. Opt.
, vol.37
, pp. 6227-6233
-
-
Canabal, H.1
Quigoga, J.A.2
Bernabeu, E.3
-
14
-
-
0000953879
-
Active phase-shifting interferometers for shape and deformation measurement
-
I. Yamaguchi, J. Liu, and J. Kato, "Active phase-shifting interferometers for shape and deformation measurement," Opt. Eng. 35, 2930-2937 (1996).
-
(1996)
Opt. Eng.
, vol.35
, pp. 2930-2937
-
-
Yamaguchi, I.1
Liu, J.2
Kato, J.3
-
15
-
-
84975646318
-
Phase measuring Ronchi test
-
K. Omura and T. Yatagai, "Phase measuring Ronchi test," Appl. Opt. 27, 523-528 (1988).
-
(1988)
Appl. Opt.
, vol.27
, pp. 523-528
-
-
Omura, K.1
Yatagai, T.2
-
16
-
-
0038502499
-
Systematic error of phase-shifting speckle interferometry
-
P. Picart, J. C. Pascal, and J. M. Breteau, "Systematic error of phase-shifting speckle interferometry," Appl. Opt. 40, 2107-2116 (2001).
-
(2001)
Appl. Opt.
, vol.40
, pp. 2107-2116
-
-
Picart, P.1
Pascal, J.C.2
Breteau, J.M.3
-
17
-
-
0020749979
-
Real-time fringe pattern analysis
-
L. Mertz, "Real-time fringe pattern analysis," Appl. Opt. 22, 1535-1539 (1983).
-
(1983)
Appl. Opt.
, vol.22
, pp. 1535-1539
-
-
Mertz, L.1
-
18
-
-
0001299516
-
Phase determination of Fizeau interference by phase-shifting interferometry
-
G. Bonsch and H. Bohme, "Phase determination of Fizeau interference by phase-shifting interferometry," Optik (Stuttgart) 82, 161 (1989).
-
(1989)
Optik (Stuttgart)
, vol.82
, pp. 161
-
-
Bonsch, G.1
Bohme, H.2
-
19
-
-
0025384081
-
Digital phase-shifting interferometry applied to partially developed speckle fields
-
G. Molesini, M. V. P. Desouza, F. Quercioli, and M. Trivi, "Digital phase-shifting interferometry applied to partially developed speckle fields," Opt. Commun. 75, 14-17 (1990).
-
(1990)
Opt. Commun.
, vol.75
, pp. 14-17
-
-
Molesini, G.1
Desouza, M.V.P.2
Quercioli, F.3
Trivi, M.4
-
20
-
-
0035329370
-
Real time calibration algorithm for phase shifting in phase-measuring profilometry
-
L. Wansong and S. Xianyu, "Real time calibration algorithm for phase shifting in phase-measuring profilometry," Opt. Eng. 40, 761-766 (2001).
-
(2001)
Opt. Eng.
, vol.40
, pp. 761-766
-
-
Wansong, L.1
Xianyu, S.2
-
21
-
-
0039481037
-
Quantitative evaluation of the interference pattern
-
Industrial Optoelectronic Measurement Systems Using Coherent Light, W. F. Fagan, ed.
-
T. M. Kreis, "Quantitative evaluation of the interference pattern," in Industrial Optoelectronic Measurement Systems Using Coherent Light, W. F. Fagan, ed., Proc. SPIE 863, 68-77 (1987).
-
(1987)
Proc. SPIE
, vol.863
, pp. 68-77
-
-
Kreis, T.M.1
-
22
-
-
0021455243
-
Measurement of phase objects using the Talbot effect and a moiré technique
-
Y. Nakano and K. Murata, "Measurement of phase objects using the Talbot effect and a moiré technique," Appl. Opt. 23, 2296-2299 (1984).
-
(1984)
Appl. Opt.
, vol.23
, pp. 2296-2299
-
-
Nakano, Y.1
Murata, K.2
|