Dynamic EFM spectroscopy studies on electric force gradients of IrO 2 nanorod arrays

Nanotechnology

Volumn 16, Issue 3, 2005, Pages

  Chiang, Daniel ^a   Lei, Philip Zifeng ^a   Zhang, Fengyan ^b   Barrowcliff, Robert ^b  

^a WASHINGTON STATE UNIVERSITY   (United States)

^b SHARP LABORATORIES OF AMERICA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLITUDE MODULATION; CHEMICAL VAPOR DEPOSITION; ELECTRIC FIELDS; ELECTRON RESONANCE; FORCE MEASUREMENT; MORPHOLOGY; NANOSTRUCTURED MATERIALS; THIN FILMS;

ELECTRIC FORCE GRADIENTS; ELECTRIC FORCE MICROSCOPY (EFM); LIFT-MODE TECHNIQUES; NANORODS;

IRIDIUM COMPOUNDS;

EID: 15844417597     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/16/3/007     Document Type: Conference Paper

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