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Volumn 275, Issue 1-2, 2005, Pages

Germanium growth on nanopatterned surface studied by STM

Author keywords

A1. Scanning tunneling microscopy; A1. Surface structure; A3. Molecular beam epitaxy, Selective epitaxy; Al. Nanostructures; B2. Semiconducting silicon compounds

Indexed keywords

ETCHING; MOLECULAR BEAM EPITAXY; NANOSTRUCTURED MATERIALS; NUCLEATION; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR QUANTUM DOTS; SURFACE ROUGHNESS;

EID: 15844414153     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2004.11.177     Document Type: Conference Paper
Times cited : (2)

References (9)
  • 2
    • 15844372574 scopus 로고    scopus 로고
    • Patent Publication Number WO9905711A1
    • M. Bruel, World Patent Publication Number WO9905711A1, 1999.
    • (1999)
    • Bruel, M.1
  • 7
    • 15844416081 scopus 로고    scopus 로고
    • Properties of Crystalline Silicon Number 20
    • R. Hull (Ed.) INSPEC, London
    • K.R. Williams, in: R. Hull (Ed.), Properties of Crystalline Silicon Number 20, Data Reviews Series, INSPEC, London, 1999, p. 822.
    • (1999) Data Reviews Series , pp. 822
    • Williams, K.R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.