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Volumn 244, Issue 1-4, 2005, Pages 365-368
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Deposition and structural properties of piezoelectric ZnO epitaxial film on p-InP (1 0 0) substrate for FBAR
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Author keywords
Piezoelectric; Semiconductors substrates; ZnO film
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
DEPOSITION;
DIFFUSION;
ELECTRODES;
EPITAXIAL GROWTH;
MAGNETRON SPUTTERING;
PIEZOELECTRICITY;
SURFACE ROUGHNESS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
ZINC OXIDE;
ELECTROMECHANICAL PROPERTIES;
EPITAXIAL FILMS;
SEMICONDUCTOR SUBSTRATES;
ZNO FILM;
THIN FILMS;
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EID: 15844403847
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2004.09.146 Document Type: Conference Paper |
Times cited : (13)
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References (16)
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