Automatic geometrical calibration for X-ray microtomography based on Fourier and Radon analysis

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5535, Issue , 2004, Pages 623-637

  Weitkamp, Timm ^a   Bleuet, Pierre ^b  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Alignment; Fourier analysis; Microtomography; Radon transform; Synchrotron radiation; X ray tomography

Indexed keywords

ALIGNMENT; COMPUTATIONAL GEOMETRY; COMPUTERIZED TOMOGRAPHY; FOURIER TRANSFORMS; IMAGE RECONSTRUCTION; OSCILLATIONS; PARAMETER ESTIMATION; SYNCHROTRON RADIATION;

FOURIER ANALYSIS; MICROTOMOGRAPHY; RADON TRANSFORMS; X-RAY TOMOGRAPHY;

X RAYS;

EID: 15844398617     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.557094     Document Type: Conference Paper

References (7)

1. J. Esthappan, H. Harauchi, and K. R. Hoffmann, "Evaluation of imaging geometries calculated from biplane images," Med. Phys. 25, pp. 965-975, 1998.
2. F. Noo, R. Clackdoyle, C. Mennessier, T. A. White, and T. J. Roney, "Analytic method based on identification of ellipse parameters for scanner calibration in cone-beam tomography," Phys. Med. Biol. 45, pp. 3489-3508, 2000.
3. D. Weiss, G. Schneider, B. Niemann, P. Guttmann, D. Rudolph, and G. Schmahl, "Computed tomography of cryogenic biological specimens based on X-ray microscopic images," Ultramicroscopy 84, pp. 185-197, 2000.
4. M. Karolczak, S. Scahller, K. Engelke, A. Lutz, U. Taubenreuther, K. Wiesent, and W. Kalender, "Implementation of a cone-beam reconstruction algorithm for the single-circle source orbit with embedded misalignment correction using homogeneous coordinates," Med. Phys. 28, pp. 2050-2069, 2001.
5. A. V. Bronnikov, "Virtual alignment of x-ray cone-beam tomography system using two calibration aperture measurements," Opt. Eng. 38, pp. 381-386, 1999.
6. Z. H. Levine, S. Grantham, S. Neogi, S. P. Frigo, I. McNulty, C. C. Retsch, Y. Wang, and T. B. Lucatorto, "Accurate pattern registration for integrated circuit tomography," J. Appl. Phys. 90, pp. 556-560, 2001.
7. P. Bleuet and T. Weitkamp, to be published.