Theoferometer for high accuracy optical alignment and metrology

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5528, Issue , 2004, Pages 305-315

  Toland, Ronald ^a   Leviton, Doug ^a   Koterba, Seth ^b  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

^b and Exercise Science   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL ALIGNMENT; THEODOLITE; THEOFEROMETERS; VECTOR METROLOGY;

ALIGNMENT; INTERFEROMETERS; LASERS; MEASUREMENTS; OPTICAL COLLIMATORS; PRODUCT DESIGN; TELESCOPES; VECTORS;

OPTICAL SYSTEMS;

EID: 13444261210     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.559969     Document Type: Conference Paper

References (9)

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4. Press et. al., Numerical Recipes in Fortran, Chap. 12&13, Cambridge University Press, New York, 1996
5. R. Toland, "Absolute Measurement of Tilts via Fourier Analysis of Interferograms," SPIE Proceedings, Aug 2004
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7. D. Leviton, "Absolute position encoders using pattern recognition," NASA Tech Briefs 24, p. 6a, June 2000
8. D. Leviton and M. Garza, "Recent advances and applications for NASA's new, ultra-high sensitivity, absolute, optical pattern recognition encoders," SPIE 4091, pp. 385-394, 2000
9. D. Leviton, "Image processing for new optical pattern recognition encoders," SPIE 4113, pp. 32-40, 2000